Homework

Homework #1: Due on Sep. 1 2011
Write a report to describe the initial C++ framework provided to you for Project 1.
Homework #2: Due on Sep. 8 2011
Answer the following questions. Provide detailed enough answers. Each answer should be at least a few sentences.
1) How do VLSI technology trends affect testing?
2) Describe what a Shmoo plot is.
3) What is the difference between verification/characterization testing and manufacturing testing?
4) Describe parametric tests.
5) Explain how test economics, due to miniaturization, dictates to adopt more and more DFT (design for testability).
6) Describe economic efficiency.
Problems: 1.1, 3.2
Homework #3: Due on Sep. 15 2011
Answer the following questions. Provide detailed enough answers. Each answer should be at least a few sentences.
1) Why, for test generation purposes, do we consider only single-stuck-at-value fault models and do not consider multiple-stuck-at faults too?
2) Describe the difference(s) between compiled-code simulation and event-driven simulation.
3) Compare parallel fault simulation and fault sampling.
Problems 4.11, 4.12, 6.2, 6.4.
Homework #4: Due on Sep. 29 2011
Problems 7.4, 7.5 (solve by showing all steps of the algorithms and by using the algorithm descriptions discussed in class), 8.4, 8.15 from textbook.
Homework #5: Due on Oct. 6 2011
Problems 8.3, 8.9, 14.2 (show transistor level diagrams), 14.4, and 14.8.
Homework #6: Due on Oct. 20 2011
Problems 15.3, 15.8, 15.10
You will read the following two tutorials and write a report (must be typed and at least 1.5 pages with font 11 and line spacing 1 line) to describe the BIST DFT technique. You may want to use also the textbook as well as any other source including the Internet. Bist tutorial 1, Bist tutorial 2.
Homework #7: Due on Oct. 25 2011
You will read the paper on negative bias temperature instability (NBTI) assigned in class and write a report of at least 1-1.5 pages. Your report should clearly identify the problem addressed in the paper, the solution proposed, and your review of it with a summary of its advantages and drawbacks. Also, you should discuss and provide details on how you would improve their solution.
Homework #8: Due on Nov. 3 2011

Part 1:
Given the characteristic polynomial:

P(x)=x8+x5+x4+x+1

Draw the schematic diagrams of the type 1 and 2 LFSRs. If output of a DUT is:

G(x) = x10+x7+x6+x5+x4+x2+1

Find out the signature under the assumption that a type 2 LSFR is used. If the output of the DUT is:

G’(x) = x10+x8+x6+x5+x4+x3

Find out if this error can be detected via signature analysis? Explain why yes or no.

Part 2:
Use the digital simulator, which you developed as part of project 1, to simulate the circuit from figure 12.2, page 419 from textbook for two consecutive vectors: 010, 100. You will have to first write the circuit.map file. Report waveforms of all signals (including the output). You will also demonstrate the simulation to me for full credit.
Part 3:
You will read the first paper on time-dependent dielectric breakdown (TDDB) and write a report of at least 1-1.5 pages. Your report should clearly identify the problem addressed in the paper, the solution proposed, and your review of it with a summary of its advantages and drawbacks. Also, you should discuss and provide details on how you would improve their solution.
Homework #9: Due on Nov. 8 2011
You will read this paper on time-dependent dielectric breakdown (TDDB) and write a report of one page. Your report should clearly identify the problem addressed in the paper, the solution proposed, and your review of it with a summary of its advantages and drawbacks. Also, you should discuss and provide details on how you would improve their solution.
Homework #10: Due on Nov. 17 2011
You will read the HCI paper indicated on the "Resources" webpage and write a report of one page (pdf of paper is available on Blackboard). Your report should clearly identify the problem addressed in the paper, the solution proposed, and your review of it with a summary of its advantages and drawbacks. Also, you should discuss and provide details on how you would improve their solution.
Homework #11: Due on Nov. 28 2011
You will read the electromigration (EM) paper indicated on the "Resources" webpage and write a report (pdf of paper is available on Blackboard). Your report should clearly identify the problem addressed in the paper, the solution proposed, and your review of it with a summary of its advantages and drawbacks. Also, you should discuss and provide details on how you would improve their solution.
Homework #12: Due on Dec. 2 2011
You will read the second paper on EM indicated on the "Resources" webpage and write a report (pdf of paper is available on Blackboard). Your report should clearly identify the problem addressed in the paper, the solution proposed, and your review of it with a summary of its advantages and drawbacks. Also, you should discuss and provide details on how you would improve their solution.