ECE-470/670
Digital
Design
II
-
Fall
2011
Course info
Syllabus: please read it!
ECE-470, Digital Design II, 3 credits
Prereq: ECE 375 with a grade of C or better.
Lecture: TuTh 2:00-3:15pm in ECE-243
Instructor
Cristinel
Ababei, cristinel.ababei(at)ndsu.edu
Ph: 701-231-7617
Office: ECE-101F
Office hours: Tuesday 10:30-11:30am, Thursday 1:00-2:00pm or by
appointment.
Bulletin description
Design and analysis of reliable digital systems through robust
information coding, fault avoidance, and fault tolerance.
Textbook and recommended references
M. Bushnell and V. Agrawal, Essentials
of
Electronic
Testing
for
Digital
Memory and
Mixed-Signal VLSI Circuits, Springer
2000.
(required)
Miron
Abramovici, Melvin A. Breuer, and Arthur D. Friedman, Digital Systems
Testing and Testable Design, Wiley-IEEE Press,
Revised edition, 1994.
Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen, VLSI Test Principles and
Architectures - Design for
Testability, Elsevier,
2006.
Course objectives
This course examines in depth theories and techniques for testing
multimillion transistor VLSI chips. The overall course objective is to
teach electrical and computer engineering students the fundamental
concepts of testing and reliability, methods of modeling and analysis
of faults, and design for testability of digital circuits and systems.
Specific objectives include the following:
1. Develop an understanding of test economics, failure mechanisms
in VLSI circuits, and characterization of failures at various levels of
circuit hierarchy.
2. Develop an understanding of reliability issues of VLSI
circuits.
3. Utilize logic and fault simulation to develop test vector
generation algorithms for combinational and sequential circuits.
4. Design testing methodologies for memory chips.
5. Utilize design for testability techniques including built-in
self-test (BIST), scan design, and boundary scan.
6. Coordinate different testing tasks (combinational testing,
sequential testing, memory testing, BIST, scan testing, etc.) so that a
chip is tested as a whole entity.
7. Apply theoretical knowledge about algorithms to solve testing
problems using a computer.
8. Use data structures and algorithms in C++ programs that are
used to create testing software tools.
9. Use VHDL/Verilog to specify digital circuit structure and
behavior and Altera FPGA development boards for testing.
10. Conduct literature survey on specific research topics, identify
current challenges, and develop solutions.
11. Prepare informative and organized project reports and presentations
that describe the methodologies employed, the results obtained, and the
conclusions made in simulation experiments.
Grading
Grade breakdown: A=[90-100], B=[80-90), C=[70-80), D=[60-70).
-- Final grade components:
- Exam 1: 25%
- Exam 2 (final): 25%
- Homework: 15%
- Projects: 35%