Here there are links to aditional resources related to the topics of this course (many thanks to those who share their course materials!).

BlackBoard

Conferences and journals
Conferences devoted to testing:
--  International Test Conference (ITC)
--  VLSI Test Symposium (VTS)
--  European Test Symposium (ETS)
--  Asian Test Symposium (ATS)
--  IEEE International On-Line Testing Symposium (IOLTS)
Other conferences with significant test component:
--  Design Automation Conference (DAC)
--  International Conference on Computer Aided Design (ICCAD)
--  International Conference on Computer Design (ICCD)
--  VLSI Design Conference (VDC)
--  Design Automation and Test in Europe (DATE)
--  International Symposium on Circuits and Systems (ISCAS)
Journals devoted to testing or with significant test component:
--  Journal of Electronic Testing: Theory and Applications (JETTA)
--  IEEE Transactions on Computer Aided Design (TCAD)
--  IEEE Transactions on Computers (TC)
--  IEEE Design and Test of Computers
--  ACM Transactions on Design Automation of Electronic Systems (TODAES)
--  IBM Journal of Research and Development

Tech news
--  EETimes
--  MIT Technology Review
--  IEEE Spectrum
--  IEEE Potentials
--  Communications of the ACM

Tech pubs
--  Test Technology Technical Council
--  International Technology Roadmap for Semiconductors (ITRS)
--  Semiconductor Industry Association (SIA)

Other courses that use the same textbook
--  Auburn
--  Rutgers
--  UMichigan
--  UConn
--  Duke
--  UCincinnati
--  UNebraska
--  UAlberta

Other courses that use different textbooks:
--  UCSB
--  Tsing Hua - Taiwan